UDC 681.325.5

Legitimacies of a degradation of light-emitting diodes

Vikulin I. М., Irkha V. I., Korobitsyn B. V., Gorbachev V. E.

The method of testing of phosphide-gallium light-emitting diodes on duration of life expectancy, considerably cutting time of a rejection of accident-sensitive light-emitting diodes in production is proposed. The individual life expectancy of each light-emitting diode from a sectional batch is defined on two measured values of luminosity with the help of the reference diagram, which is created by results of trials concerning small amount of hardware products.

Odessa Popov National Academy of Communication.