UDC 621.315.592

Express-method of semiconductor diode crystal quality diagnostics

Pavljuk S. P., Ishchuk L. V., Kislitsyn V. M.

The possibility of using of the IR radiation from semiconductor for an express-diagnostics of the semiconductor diode quality was reasoned. The method of separation of the recombination and thermal radiaton components from the heated diod crystal was developed. We showed the possibility of selection of the diod crystal soldering conditions when the crystal surface was heated homogeneously using diod thermal radiation.

Ukraine, Kiev, T. G. Shevchenko Kiev National University, Paton Institute of Electric Welding.